厚靶中痕量元素分析用质子感生X射线发射的标准化
Standardization of Proton Induced X-Ray Emission for Analysis of Trace Elements in Thick Targets
摘要：
本文介绍了质子激发X射线荧光分析（PIXE）技术在厚标样微量元素分析中的标准化。三种标准参考材料（SRM），即钛、铜和铁基合金，因其可用性而用于研究。利用5 UDH-II串列加速器将质子束加速到2.57 MeV能量，并对样品进行了不同几何形状和持续时间的辐照。使用多通道光谱分析仪获取光谱，同时使用GUPIXWIN模型进行光谱分析，用于测定痕量元素的元素浓度。将获得的实验数据与理论数据进行比较，发现结果非常一致。
英文摘要：
This paper presents the standardization of Proton Induced X-rays Emission (PIXE) technique for the trace element analysis of thick standard samples. Three standard reference materials (SRMs) viz-à-vis titanium, copper and iron base alloys were used for the study due to their availability. The protons beam was accelerated up to 2.57 MeV energy by 5UDH-II tandem Pelletron accelerator and samples were irradiated at different geometry and durations. Spectrum was acquired using a multi-channel spectrum analyzer while spectrum analysis was done using a GUPIXWIN model for determination of elemental concentrations of trace elements. The obtained experimental data was compared with theoretical data and results were found in close agreement.
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