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arXiv 1702.06258cond-mat.mtrl-sci
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改变钨层厚度全光探测W/CoFeB/SiO2异质结自旋霍尔角

All-optical Detection of Spin Hall Angle in W/CoFeB/SiO2 Heterostructures by Varying Tungsten Layer Thickness

Sucheta Mondal, Samiran Choudhury, Neha Jha, Arnab Ganguly, Jaivardhan Sinha, Anjan Barman

摘要:

先进自旋电子学器件的发展取决于纯自旋电流的有效产生和利用。在具有大的自旋-轨道耦合的材料中,自旋霍尔效应可以将电荷电流转换成纯自旋电流,并且对于实现小型化和能量高效的自旋电子器件,期望通过自旋霍尔角(SHA)量化的大的转换效率。本文报道了在W厚度可变的Sub/W(t)/Co20 Fe 60 B20(3 nm)/SiO2(2 nm)异质结构中β-钨(\b{eta} -W)薄膜中的一个巨大的SHA。我们采用了一种全光时间分辨磁光克尔效应显微镜的明确确定SHA使用的吉尔伯特阻尼的调制相邻的铁磁层从W层的自旋轨道扭矩的原则。观察到SHA随W层厚度(t)的非单调变化,在t = 3 nm处具有约0.4的最大值,随后在t = 6 nm处突然减小到非常低的值。SHA随W厚度的这种变化与W的自旋扩散长度以上的W的厚度相关的结构相变和电阻率变化很好地相关,而在此长度以下的W/CoFeB的界面电子效应影响SHA的估计。

英文摘要:

The development of advanced spintronics devices hinges on the efficient generation and utilization of pure spin current. In materials with large spin-orbit coupling, the spin Hall effect may convert charge current to pure spin current and a large conversion efficiency, which is quantified by spin Hall angle (SHA), is desirable for the realization of miniaturized and energy efficient spintronic devices. Here, we report a giant SHA in beta-tungsten (\b{eta}-W) thin films in Sub/W(t)/Co20Fe60B20(3 nm)/SiO2(2 nm) heterostructures with variable W thickness. We employed an all-optical time-resolved magneto-optical Kerr effect microscope for an unambiguous determination of SHA using the principle of modulation of Gilbert damping of the adjacent ferromagnetic layer by the spin-orbit torque from the W layer. A non-monotonic variation of SHA with W layer thickness (t) is observed with a maximum of about 0.4 at about t = 3 nm, followed by a sudden reduction to a very low value at t = 6 nm. This variation of SHA with W-thickness correlates well with the thickness dependent structural phase transition and resistivity variation of W above the spin diffusion length of W, while below this length the interfacial electronic effect at W/CoFeB influences the estimation of SHA.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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