LAMP软X射线望远镜多层镀膜偏振镜的测试
Testing multilayer-coated polarizing mirrors for the LAMP soft X-ray telescope
摘要：
LAMP（Lightweight Asymmetry and Magnetism Probe）X射线望远镜是一个任务概念，通过成像镜测量250 eV的X射线天文源的偏振，成像镜以接近偏振角的入射角反射，即，45度因此，这将需要采用多层膜与几个纳米的d-间距，以提高反射率。镍电铸技术已成功地用于制作X射线望远镜SAX、XMM-牛顿和Swift/XRT的高角分辨率成像镜。我们正在研究这种综合技术作为一种可能的技术，制造聚焦镜的大面积无掩模光敏聚合。虽然这种反射镜在掠入射时已经表现出很好的反射性能，但在45 °的大角度下的反射率和散射特性还没有被直接测试。其他可能的基板由薄玻璃箔或硅晶片表示。在本文中，我们提出的X射线反射率运动的结果进行的BEAR光束线的Elettra - Sincrotrone的里雅斯特的多层涂层的各种成分（铬/C，钴/C），沉积在镍，硅和玻璃基板上，用不同的溅射参数，使用偏振X射线在光谱范围240 - 290 eV。
英文摘要：
The LAMP (Lightweight Asymmetry and Magnetism Probe) X-ray telescope is a mission concept to measure the polarization of X-ray astronomical sources at 250 eV via imaging mirrors that reflect at incidence angles near the polarization angle, i.e., 45 deg. Hence, it will require the adoption of multilayer coatings with a few nanometers d-spacing in order to enhance the reflectivity. The nickel electroforming technology has already been successfully used to fabricate the high angular resolution imaging mirrors of the X-ray telescopes SAX, XMM-Newton, and Swift/XRT. We are investigating this consolidated technology as a possible technique to manufacture focusing mirrors for LAMP. Although the very good reflectivity performances of this kind of mirrors were already demonstrated in grazing incidence, the reflectivity and the scattering properties have not been tested directly at the unusually large angle of 45 deg. Other possible substrates are represented by thin glass foils or silicon wafers. In this paper we present the results of the X-ray reflectivity campaign performed at the BEAR beamline of Elettra - Sincrotrone Trieste on multilayer coatings of various composition (Cr/C, Co/C), deposited with different sputtering parameters on nickel, silicon, and glass substrates, using polarized X-rays in the spectral range 240 - 290 eV.
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