arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1608.00533cs.LOmath.LO
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不可靠电路逻辑中的判定与优化问题

Decision and optimization problems in the Unreliable-Circuit Logic

J. Rasga, C. Sernadas, P. Mateus, A. Sernadas

摘要:

分析了逻辑UCL在不可靠门电路推理中的目标约束有效性和模型证明问题。此外,两个额外的问题,由应用程序的动机,进行了研究。一个是找到门的可靠性率的界限,以确保给定的电路具有预期的成功率。另一个是找到一个可靠率的门,最大限度地提高了一个给定的电路的成功率。对这些问题提出了完善的算法,并研究了它们的计算复杂性。

英文摘要:

The ambition constrained validity and the model witness problems in the logic UCL, for reasoning about circuits with unreliable gates, are analyzed. Moreover, two additional problems, motivated by the applications, are studied. One consists of finding bounds on the reliability rate of the gates that ensure that a given circuit has an intended success rate. The other consists of finding a reliability rate of the gates that maximizes the success rate of a given circuit. Sound and complete algorithms are developed for these problems and their computational complexity is studied.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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