纳米光纤的无损轮廓测量
Non-destructive profilometry of optical nanofibres
摘要：
单模纳米光纤是广泛应用和新兴技术的核心组成部分。在过去十年中，对它们的制造进行了广泛的研究，但最终亚微米产品的成像仅限于破坏性或低精度技术。在这里，我们展示了一种基于光散射的扫描方法，该方法使用探针纳米纤维来局部散射样品纳米纤维的倏逝场。该方法不会损坏样品纳米纤维，并且仅使用与标准纤维拉拔器设置相同的设备就可以容易地实现。我们展示了亚纳米径向分辨率在视频速率（0.7纳米，10毫秒）的单模纳米纤维，允许一个完整的高精度的配置文件，以获得在几分钟内的制造。因此，该方法能够对光学纳米纤维进行非破坏性，快速和精确的表征，其应用范围从光学传感器和冷原子陷阱到非线性光学。
英文摘要：
Single-mode optical nanofibres are a central component of a broad range of applications and emerging technologies. Their fabrication has been extensively studied over the past decade, but imaging of the final sub-micrometre products has been restricted to destructive or low-precision techniques. Here we demonstrate an optical scattering-based scanning method that uses a probe nanofibre to locally scatter the evanescent field of a sample nanofibre. The method does not damage the sample nanofibre and is easily implemented only using the same equipment as in a standard fibre puller setup. We demonstrate sub-nanometre radial resolution at video rates (0.7 nm in 10 ms) on single mode nanofibres, allowing for a complete high-precision profile to be obtained within minutes of fabrication. The method thus enables non-destructive, fast and precise characterisation of optical nanofibers, with applications ranging from optical sensors and cold atom traps to non-linear optics.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
