LHCb μ子探测器前端死时间的测量及其对μ子探测效率贡献的评估
Measurement of the front-end dead-time of the LHCb muon detector and evaluation of its contribution to the muon detection inefficiency
摘要：
描述了一种方法，该方法允许从在20 MHz的聚束交叉率下在不同亮度下进行的一系列测量中推断LHCb μ子探测器的前端电子器件的死时间。死区时间的测量值范围从70 ns到100 ns。这些结果允许估计的μ子探测器的性能在未来的束交叉率为40 MHz，并在更高的光度。
英文摘要：
A method is described which allows to deduce the dead-time of the front-end electronics of the LHCb muon detector from a series of measurements performed at different luminosities at a bunch-crossing rate of 20 MHz. The measured values of the dead-time range from 70 ns to 100 ns. These results allow to estimate the performance of the muon detector at the future bunch-crossing rate of 40 MHz and at higher luminosity.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
