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arXiv 1505.03224physics.optics
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通过硅纳米线中的慢光监测640 Gb/s的光学性能

Optical performance monitoring at 640Gb/s via slow-light in a silicon nanowire

B. Corcoran, C. Monat, M. Pelusi, C. Grillet, T. P. White, L. O Faolain, T. F. Krauss, B. J. Eggleton, David J. Moss

摘要:

我们演示了在40 Gb/s,160 Gb/s和640 Gb/s的比特率下,在紧凑的(80微米)色散工程的二维硅光子晶体波导中使用慢光增强型光学三次谐波产生(THG)的带内光学信噪比(OSNR)和残余色散的光学性能监测。我们表明,在640 Gb/s的信号处理相对于40 Gb/s的增强没有固有的退化,并且该器件应该在1 Tb/s以上工作。这项工作代表了硅器件处理速度创纪录的16倍增长,并为慢光在超高带宽电信系统中发挥关键作用打开了大门。

英文摘要:

We demonstrate optical performance monitoring of in-band optical signal to noise ratio (OSNR) and residual dispersion, at bit rates of 40Gb/s, 160Gb/s and 640Gb/s, using slow-light enhanced optical third harmonic generation (THG) in a compact (80 micron) dispersion engineered 2D silicon photonic crystal waveguide. We show that there is no intrinsic degradation in the enhancement of the signal processing at 640 Gb/s relative to that at 40Gb/s, and that this device should operate well above 1Tb/s. This work represents a record 16-fold increase in processing speed for a silicon device, and opens the door for slow light to play a key role in ultra-high bandwidth telecommunications systems.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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