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arXiv 1503.08741cond-mat.mes-hallcond-mat.str-el
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近藤陷阱的自旋-电荷噪声

Spin versus charge noise from Kondo traps

Luis G. G. V. Dias da Silva, Rogerio de Sousa

摘要:

磁噪声和电荷噪声在固态器件中具有共同的微观起源,如通用电子陷阱模型所描述的。尽管这一共同的起源,磁(自旋)和电荷噪声谱密度显示显着不同的行为时,考虑到多粒子的相关性,导致出现的近藤效应。我们的数值重整化群的结果表明,虽然自旋噪声是一个通用的函数的近藤温度,电荷噪声仍然很好地描述了单粒子理论,即使当陷阱是深近藤制度。这种差异甚至在无序存在的情况下也存在,这表明在对磁(而不是电荷)波动敏感的设备中,噪声可以更易于管理,并且可以在自旋噪声光谱实验中观察到近藤效应的签名。

英文摘要:

Magnetic and charge noise have common microscopic origin in solid state devices, as described by a universal electron trap model. In spite of this common origin, magnetic (spin) and charge noise spectral densities display remarkably different behaviours when many-particle correlations are taken into account, leading to the emergence of the Kondo effect. Our numerical renormalization group results indicate that while spin noise is a universal function of the Kondo temperature, charge noise remains well described by single-particle theory even when the trap is deep in the Kondo regime. This difference survives even in the presence of disorder, showing that noise can be more manageable in devices that are sensitive to magnetic (rather than charge) fluctuations and that the signature of the Kondo effect can be observed in spin noise spectroscopy experiments.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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