狭缝光谱仪的仪器轮廓
On the Instrument Profile of Slit Spectrographs
摘要：
我们推导出一个解析表达式的狭缝光谱仪，也被称为线扩展函数的仪器配置文件。虽然这个问题不是新的，我们的治疗依赖于操作的方法来描述衍射光学系统，它提供了一个通用的框架，在不同的照明条件下的狭缝光谱仪的性能分析。基于我们的研究结果，我们提出了一个近似的狭缝光谱仪的光谱分辨率，考虑到衍射效应和采样的检测器，这改善了经常采用的近似的基础上的根和平方的个人贡献从狭缝，光栅，和检测器像素。
英文摘要：
We derive an analytic expression for the instrument profile of a slit spectrograph, also known as the line spread function. While this problem is not new, our treatment relies on the operatorial approach to the description of diffractive optical systems, which provides a general framework for the analysis of the performance of slit spectrographs under different illumination conditions. Based on our results, we propose an approximation to the spectral resolution of slit spectrographs, taking into account diffraction effects and sampling by the detector, which improves upon the often adopted approximation based on the root-sumsquare of the individual contributions from the slit, the grating, and the detector pixel.
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