二维弱散射目标单幅HRTEM像反对称像差的数值校正
Numerical correction of anti-symmetric aberrations in single HRTEM images of weakly scattering 2D-objects
摘要：
在这里，我们提出了一种数值后处理方法，用于消除弱散射二维物体的高分辨率透射电子显微镜（HRTEM）图像中反对称剩余像差的影响。该方法基于将具有相反相位的相同像差应用于所记录的图像强度的傅里叶变换，并且随后反转傅里叶变换。我们提出的理论依据的方法和它的验证的基础上模拟图像的情况下，低阶反对称像差。最终，该方法被应用到实验硬件像差校正的HRTEM图像的单层石墨烯和MoSe 2产生的图像具有强烈降低的残余低阶像差，从而提高了可解释性。或者，这种方法可以用来估计通过试验和错误的残余反对称像差的HRTEM图像的弱散射对象。
英文摘要：
Here, we present a numerical post-processing method for removing the effect of anti-symmetric residual aberrations in high-resolution transmission electron microscopy (HRTEM) images of weakly scattering 2D-objects. The method is based on applying the same aberrations with the opposite phase to the Fourier transform of the recorded image intensity and subsequently inverting the Fourier transform. We present the theoretical justification of the method and its verification based on simulated images in the case of low-order anti-symmetric aberrations. Ultimately the method is applied to experimental hardware aberration-corrected HRTEM images of single-layer graphene and MoSe2 resulting in images with strongly reduced residual low-order aberrations, and consequently improved interpretability. Alternatively, this method can be used to estimate by trial and error the residual anti-symmetric aberrations in HRTEM images of weakly scattering objects.
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