arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1406.6980hep-ph
收藏

LHC时代的弱电精度测试和双回路水平的Z衰减形状因子

Electroweak precision tests in the LHC era and Z-decay form factors at two-loop level

A. Freitas

摘要:

本文从唯象和理论两个方面综述了希格斯玻色子玻色子发现后的弱电精密检验现状。在标准模型中,所有Z极量的预测现在都可以在完整的费米子双环阶得到。这些修正的计算是基于总Z玻色子宽度的例子来描述的。最后,展望了未来高亮度e ~+e-对撞机的实验改进和理论挑战。

英文摘要:

The current status of electroweak precision tests after the discovery of the Higgs boson is reviewed, both from a phenomenological and from a theoretical point of view. Predictions for all Z-pole quantities are now available at the complete fermionic two-loop order within the Standard Model. The calculation of these corrections is described based on the example of the total Z-boson width. Finally, an outlook on the experimental improvements and theoretical challenges for a future high-luminosity e+e- collider is given.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑