在半导体聚合物上快速超高密度写入低电导率图形
Fast Ultrahigh-Density Writing of Low Conductivity Patterns on Semiconducting Polymers
摘要：
对改善数据存储、分子电子学和光电子学的局限性的特殊兴趣促进了用于在微米和纳米尺度上图案化聚合物的技术的不断增加的数量的发展。他们中的大多数依赖于原子力显微镜热或静电诱导质量传输，从而创建地形特征。在这里，我们表明，机械相互作用的原子力显微镜的尖端与表面的一类共轭聚合物产生局部增加的分子无序，诱导局部降低的半导体电导率，不相关的可检测的修改的表面形貌。这种现象允许以超过20 $μm s^{-1}$的前所未有的速度在聚合物表面上快速产生低电导率图案;路径具有尖端尺寸（20 nm）量级的分辨率，并且通过导电原子力显微镜尖端在电导率图中检测。
英文摘要：
The exceptional interest in improving the limitations of data storage, molecular electronics, and optoelectronics has promoted the development of an ever increasing number of techniques used to pattern polymers at micro and nanoscale. Most of them rely on Atomic Force Microscopy to thermally or electrostatically induce mass transport, thereby creating topographic features. Here we show that the mechanical interaction of the tip of the Atomic Force Microscope with the surface of a class of conjugate polymers produces a local increase of molecular disorder, inducing a localized lowering of the semiconductor conductivity, not associated to detectable modifications in the surface topography. This phenomenon allows for the swift production of low conductivity patterns on the polymer surface at an unprecedented speed exceeding 20 $μm s^{-1}$; paths have a resolution in the order of the tip size (20 nm) and are detected by a Conducting-Atomic Force Microscopy tip in the conductivity maps.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
