由m线测量反演三层波导光学和几何特性的方法
A method to retrieve optical and geometrical characteristics of three layer waveguides from m-lines measurements
摘要：
本文考虑三层光波导，提出了一种用m线光谱法同时测量各层折射率和厚度的方法。建立了三层波导模式色散方程，并给出了数值求解方法。该方法的准确性进行评估，通过数值模拟与噪声数据和实验证明，使用PZT薄膜放置在两个ZnO层之间。
英文摘要：
We consider three layer optical waveguides and present a method to measure simultaneously the refractive index and the thickness of each layer with m-lines spectroscopy. We establish the three layer waveguide modal dispersion equations and describe a numerical method to solve these equations. The accuracy of the method is evaluated by numerical simulations with noisy data and experimentally demonstrated using a PZT thin film placed between two ZnO layers.
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