理解持久性：H2RG成像传感器的3D陷阱图
Understanding Persistence: A 3D Trap Map of an H2RG Imaging Sensor
摘要：
有几种理论可以解释持久性，其中大多数都围绕着陷阱的分布。我们的目标是模拟持久性和说明这个复杂的问题与3D陷阱地图。对于这个实验，我们改变检测器的电压偏置，以模拟当检测器暴露于光时发生的耗尽区的变化。这使我们能够测量耗尽区中陷阱的分布。本文将探讨这个实验的结果，并讨论其影响。
英文摘要：
Several theories exist to explain persistence, most of which revolve around the distribution of traps. We aim to simulate persistence and illustrate this complex issue with a 3D trap map. For this experiment, we vary the detector voltage bias to simulate the change in the depletion region that occurs when the detector is exposed to light. This allows us to measure the distribution of traps in the depletion region. This paper will explore the results from this experiment and discuss the implications.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
