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arXiv 1402.0040cond-mat.mes-hall
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用重整化群计算研究石墨烯中的门控可调近藤电阻率和退相速率

Gate-tunable Kondo resistivity and dephasing rate in graphene studied by numerical renormalization group calculations

Po-Wei Lo, Guang-Yu Guo, Frithjof B. Anders

摘要:

我们调查的电阻率和退相率在近藤政权由于磁性杂质在石墨烯与不同的化学势($μ$)。用单轨道赝能隙非对称Anderson杂质模型描述了石墨烯中碳空位或磁性吸附原子引起的近藤效应。我们发现,尽管Anderson杂质模型是一个混合价体系,但它可以被门电压驱动到Kondo [ $μ> μ_c$(临界值)$>0$ ]或混合价($μ\approx μ_c$)或空轨道($μ< μ_c$)区,从而在每个区产生电阻率和退相速率的特征。具体地,在$μ< μ_c$的情况下,不同$μ$的电阻率(失相速率)曲线的形状几乎相同。然而,随着温度降低,它们开始在较低的$T/T_K$下增加到最大值,但比正常金属更快[作为$(T_K/T)^{3/2}$ ][这里$T$($T_K$)表示(Kondo)温度]。当$T$进一步减小时,在达到最大值之后,失相速率比正常金属中下降得更快,表现为$(T/T_K)^3$而不是$(T/T_K)^2$。此外,电阻率在接近$T_K$的饱和值以上具有明显的峰值。相反,在$μ> μ_c$的情况下,电阻率曲线在10 $T_K$以上具有额外的宽肩,并且失相速率呈现出有趣的肩峰形状。在窄边界区($μ\approx μ_c$),电阻率和退相速率曲线与正常金属中的相应曲线相似。这解释了来自最近对具有缺陷的石墨烯的实验的常规近藤状电阻率。根据计算的$T$相关谱函数、关联自能和重整化杂质能级,分析了电阻率和退相速率。

英文摘要:

We investigate the resistivity and dephasing rate in the Kondo regime due to magnetic impurities in graphene with different chemial potentials ($μ$). The Kondo effect due to either carbon vacancies or magnetic adatoms in graphene is described by the single-orbital pseudo-gap asymmetric Anderson impurity model. We find that although the Anderson impurity model considered here is a mixed valence system, it can be drived into either the Kondo [$μ> μ_c$ (critical value) $>0$] or mixed valency ($μ\approx μ_c$) or empty orbital ($μ< μ_c$) regime by a gate voltage, giving rise to characteristic features in resistivity and dephasing rate in each regime. Specifically, in the case of $μ< μ_c$, the shapes of the resistivity (dephasing rate) curves for different $μ$ are nearly identical. However, as temperature decreases, they start to increase to their maxima at a lower $T/T_K$ but more rapidly [as $(T_K/T)^{3/2}$] than in normal metals [here $T$ ($T_K$) denotes the (Kondo) temperature]. As $T$ further decreases, after reaching the maximum, the dephasing rate drops more quickly than in normal metals, behaving as $(T/T_K)^3$ instead of $(T/T_K)^2$. Furthermore, the resistivity has a distinct peak above the saturation value near $T_K$. In the case of $μ> μ_c$, in contrast, the resistivity curve has an additional broad shoulder above 10$T_K$ and the dephasing rate exhibits an interesting shoulder-peak shape. In the narrow boundary region ($μ\approx μ_c$), both the resistivity and dephasing rate curves are similar to the corresponding ones in normal metals. This explains the conventional Kondo like resistivity from recent experiments on graphene with defects. The resistivity and dephasing rate are analysized in terms of the calculated $T$-dependent spectral function, correlation self-energy and renormalized impurity level.

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