AGIPD 0.4组件在PETRA III的光束线P10处的性能测试
Performance tests of an AGIPD 0.4 assembly at the beamline P10 of PETRA III
摘要：
自适应增益积分像素检测器（AGIPD）是一种新型的检测器系统，目前正在由DESY，瑞士Paul Scherrer研究所，汉堡大学和波恩大学合作开发，主要设计用于欧洲XFEL。为了验证该探测器的关键功能，AGIPD 0.4测试芯片组件在DESY的PETRA III同步加速器的P10光束线上进行了测试。测试芯片成功地同时成像了直接同步加速器光束和单个7.05 keV光子，证明了XFEL实验所需的大动态范围。测试样品的X射线散射测量结果与标准测量结果一致，并显示了芯片在微秒时间尺度上观察动态的能力。
英文摘要：
The Adaptive Gain Integrating Pixel Detector (AGIPD) is a novel detector system, currently under development by a collaboration of DESY, the Paul Scherrer Institute in Switzerland, the University of Hamburg and the University of Bonn, and is primarily designed for use at the European XFEL. To verify key features of this detector, an AGIPD 0.4 test chip assembly was tested at the P10 beamline of the PETRA III synchrotron at DESY. The test chip successfully imaged both the direct synchrotron beam and single 7.05 keV photons at the same time, demonstrating the large dynamic range required for XFEL experiments. X-ray scattering measurements from a test sample agree with standard measurements and show the chip's capability of observing dynamics at the microsecond time scale.
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