arXiv 1303.21342013-03-08cond-mat.mes-hall

Simultaneous quantitative imaging of surface and magnetic forces

Daniel Forchheimer, Daniel Platz, Erik A. Tholen, David B. Haviland

DOI：: 10.1063/1.4812979

英文摘要：

We demonstrate quantitative force imaging of long-range magnetic forces simultaneously with near-surface van-der-Waals and contact-mechanics forces using intermodulation atomic force microscopy. Magnetic forces at the 200 pN level are separated from near-surface forces at the 30 nN level. Imaging of these forces is performed in both the contact and non-contact regimes of near-surface interactions.

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