偏振分析法测量单个荧光纳米发射体的三维取向
Three-dimensional orientation measurement of a single fluorescent nanoemitter by polarization analysis
摘要：
我们从理论上和实验上证明，一个单一的荧光纳米发射器的三维取向可以通过偏振分析的发射光（而激发偏振分析只提供了面内取向）。通过偏振测量法确定发射器取向需要理论描述，包括客观数值孔径、发射偶极子的一维或二维性质以及偶极子附近的环境。我们开发了一个模型，涵盖了最实验相关的显微镜配置，并提供有用的取向测量的分析关系。我们对高质量的核壳结构的CdSe/CdS纳米晶体进行了偏振测量，并证明它们可以近似为两个正交的简并偶极子。最后，我们表明，偶极子的取向可以推断，即使在附近的金膜的偶极子的偏振测量，而在这种情况下，完善的散焦显微镜是不合适的。
英文摘要：
We demonstrate theoretically and experimentally that the three-dimensional orientation of a single fluorescent nano-emitter can be determined by polarization analysis of the emitted light (while excitation polarization analysis provides only the in-plane orientation). The determination of the emitter orientation by polarimetry requires a theoretical description including the objective numerical aperture, the 1D or 2D nature of the emitting dipole and the environment close to the dipole. We develop a model covering most experimentally relevant microscopy configurations and provide analytical relations useful for orientation measurements. We perform polarimetric measurements on high-quality core-shell CdSe/CdS nanocrystals and demonstrate that they can be approximated by two orthogonal degenerated dipoles. Finally, we show that the orientation of a dipole can be inferred by polarimetric measurement even for a dipole in the vicinity of a gold film, while in this case the well-established defocused microscopy is not appropriate.
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