“数字”电子衍射-看到全貌
'Digital' Electron Diffraction - Seeing the Whole Picture
摘要：
会聚束电子衍射在几纳米尺度上进行对称性测定的优点是众所周知的。在实践中，由于对于高能电子衍射的小布拉格角对电子束的角度范围施加的限制，即入射束的大会聚角导致衍射图案中的重叠信息，该方法经常受到限制。自20世纪80年代以来，通过在照射面积和光束会聚之间做出妥协，克服了单个衍射光束的这种限制的技术已经普遍可用。在这里，我们描述了一种简单的技术，克服了所有这些问题，使用计算机控制，给出了电子衍射数据在一个大的角度范围内，许多衍射光束从体积由聚焦电子束（通常是几纳米或更少）。信息量的增加显著提高了解释的容易性，并扩大了该技术的适用性，特别是对于薄材料或具有较大晶格参数的材料。
英文摘要：
The advantages of convergent beam electron diffraction for symmetry determination at the scale of a few nm are well known. In practice, the approach is often limited due to the restriction on the angular range of the electron beam imposed by the small Bragg angle for high energy electron diffraction, i.e. a large convergence angle of the incident beam results in overlapping information in the diffraction pattern. Techniques have been generally available since the 1980s which overcome this restriction for individual diffracted beams, by making a compromise between illuminated area and beam convergence. Here, we describe a simple technique which overcomes all of these problems using computer control, giving electron diffraction data over a large angular range for many diffracted beams from the volume given by a focused electron beam (typically a few nm or less). The increase in the amount of information significantly improves ease of interpretation and widens the applicability of the technique, particularly for thin materials or those with larger lattice parameters.
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