拓扑绝缘体的同步辐射研究
Synchrotron-radiation studies of topological insulators
摘要：
拓扑绝缘体（TI）是近年来发现的一类量子材料，目前正引起人们的广泛关注。事实上，TI最有趣的方面不是它们是大块绝缘体，而是它们的表面支持具有某些特殊性质的局部金属态，其中包括特征自旋纹理。最重要的是，这些金属态的存在不是表面性质，而是体能带结构的拓扑结构所要求的。本章介绍了透明导电材料的物理和能带结构，以及利用同步辐射技术，特别是角分辨光电子能谱（ARPES）研究透明导电材料。
英文摘要：
Topological insulators (TIs) are a recently discovered class of quantum materials that are currently attracting considerable attention. The most interesting aspect of the TIs is, in fact, not that they are bulk insulators but that their surfaces support localized metallic states with some special properties, among others a characteristic spin texture. Most importantly, the existence of these metallic states is not a a surface property; it is required by the topology of the bulk band structure. This Chapter gives an accessible introduction into the physics and band structure of TI materials and into the study of TIs with synchrotron radiation-based techniques, in particular angle-resolved photoemission spectroscopy (ARPES).
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