TOF端盖BESIII升级的GEANT4仿真研究
A GEANT4 Simulation Studyof BESIII endcap TOF Upgrade
摘要：
建立了一个基于GEANT 4的Monte-Carlo模型，用于研究北京谱仪（BESIII）端盖飞行时间（ETOF）的性能。研究发现，多散射效应主要来自于MDC端盖材料，会引起ETOF读出单元的多次击中，从而显著影响ETOF的时序特性。具有更小读出单元结构的多间隙电阻板室（MRPC）更适合于ETOF探测器，这是由于显著降低了多命中率，从目前使用的基于闪烁器的ETOF的71.5%降低到基于MRPC的ETOF的21.8%或16.7%，这取决于所使用的读出垫尺寸。MRPC ETOF的定时性能也得到了改善。这些模拟结果表明，并指导ETOF升级工作在BESIII。
英文摘要：
A GEANT4-based Monte-Carlo model is developed to study the performance of Endcap Time-Of-Flight (ETOF) at BESIII. It's found that the multiple scattering effects, mainly from the materials at the MDC endcap, can cause multi-hit on the ETOF's readout cell and significantly influence the timing property of ETOF. Multi-gap Resistive Plate Chamber (MRPC) with a smaller readout cell structure is more suitable for ETOF detector due to significantly reduced multi-hit rate, from 71.5% for currently-used scintillator-based ETOF to 21.8% or 16.7% for MRPC-based ETOF, depending on the readout pad size used. The timing performance of a MRPC ETOF is also improved. These simulation results suggest and guide an ETOF upgrade effort at BESIII.
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