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arXiv 1208.0519cond-mat.mes-hallquant-ph
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硅电荷量子比特中的相干量子振荡

Coherent Quantum Oscillations in a Silicon Charge Qubit

Zhan Shi, C. B. Simmons, Daniel. R. Ward, J. R. Prance, R. T. Mohr, Teck Seng Koh, John King Gamble, Xian. Wu, D. E. Savage, M. G. Lagally, Mark Friesen, S. N. … 展开作者

Zhan Shi, C. B. Simmons, Daniel. R. Ward, J. R. Prance, R. T. Mohr, Teck Seng Koh, John King Gamble, Xian. Wu, D. E. Savage, M. G. Lagally, Mark Friesen, S. N. Coppersmith, M. A. Eriksson

摘要:

实验研究了Si/SiGe异质结双量子点中电荷量子比特的快速量子振荡。测得的非均匀退相时间T2* 范围从127 ps到~ 2.1 ns;它基本上取决于两个量子比特状态的能量差如何随外部电压变化,与由失谐噪声(改变量子比特双阱电势的不对称性的电荷噪声)主导的退相干过程一致。在具有最短T2* 的制度中,施加电荷回波脉冲序列将测量的非均匀退相干时间从127 ps增加到760 ps,表明低频噪声过程是重要的失相机制。

英文摘要:

Fast quantum oscillations of a charge qubit in a double quantum dot fabricated in a Si/SiGe heterostructure are demonstrated and characterized experimentally. The measured inhomogeneous dephasing time T2* ranges from 127ps to ~2.1ns; it depends substantially on how the energy difference of the two qubit states varies with external voltages, consistent with a decoherence process that is dominated by detuning noise(charge noise that changes the asymmetry of the qubit's double-well potential). In the regime with the shortest T2*, applying a charge-echo pulse sequence increases the measured inhomogeneous decoherence time from 127ps to 760ps, demonstrating that low-frequency noise processes are an important dephasing mechanism.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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