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arXiv 1207.0945cond-mat.mes-hall
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用片上谐振器探测微波频率下的量子点导纳

Quantum dot admittance probed at microwave frequencies with an on-chip resonator

T. Frey, P. J. Leek, M. Beck, J. Faist, A. Wallraff, K. Ensslin, T. Ihn, M. Büttiker

摘要:

我们提出了一个量子点隧道耦合到二维电子气的动态导纳的微波频率测量。测量是通过一个高品质的6.75 GHz的片上谐振器电容耦合到点。谐振器的频率被发现移动向下和向上接近对应于系统的电抗的符号从电容性到电感性的变化的点的电导谐振。观测结果与散射矩阵模型一致。电抗的符号取决于点与电导谐振的失谐以及相对于谐振器频率的到引线的隧道速率的幅度。当隧道耦合和温度与谐振器频率相比足够小时,在电导谐振上观察到感应响应。

英文摘要:

We present microwave frequency measurements of the dynamic admittance of a quantum dot tunnel coupled to a two-dimensional electron gas. The measurements are made via a high-quality 6.75 GHz on-chip resonator capacitively coupled to the dot. The resonator frequency is found to shift both down and up close to conductance resonance of the dot corresponding to a change of sign of the reactance of the system from capacitive to inductive. The observations are consistent with a scattering matrix model. The sign of the reactance depends on the detuning of the dot from conductance resonance and on the magnitude of the tunnel rate to the lead with respect to the resonator frequency. Inductive response is observed on a conductance resonance, when tunnel coupling and temperature are sufficiently small compared to the resonator frequency.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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