绝缘薄膜上STM结中多体干涉阻塞的形貌指纹
Topographical fingerprints of many-body interference blocking in STM junctions on thin insulating films
摘要：
负微分电导（NDC）是分子纳米结中普遍存在的一种非线性输运现象。它的物理起源可能是最多样化的。在具有轨道简并多体态的旋转对称分子中，它可以归因于干涉效应。在本文中，我们建立了一个标准，以确定相关的光谱和地形信息的STM单分子测量的干扰阻塞的情况。模拟的电流电压特性和电流映射的铜酞菁（CuPc）在薄绝缘膜上的实验相关的例子。
英文摘要：
Negative differential conductance (NDC) is a non-linear transport phenomenon ubiquitous in molecular nanojunctions. Its physical origin can be the most diverse. In rotationally symmetric molecules with orbitally degenerate many-body states, it can be ascribed to interference effects. We establish in this paper a criterion to identify the interference blocking scenario by correlating the spectral and the topographical information achievable in an STM single molecule measurement. Simulations of current voltage characteristics and current maps for a Cu-Phthalocyanine (CuPc) on a thin insulating film are presented as experimentally relevant examples.
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