无序金属环中的弹道持续电流：令人困惑的实验值的起源
Ballistic persistent currents in disordered metallic rings: Origin of puzzling experimental values
摘要：
本文用微观方法计算了由于随机晶界和粗糙边缘引起的无序状态下正常金属环中的典型持续电流（$I_{typ}$）。如果无序是由于粗糙的边缘，弹道电流$I_{typ}\simeq e v_F/L$被发现，尽管扩散电阻（$ \propto L/l$），其中$v_F$是费米速度，$l$是平均自由程，和$L \gg l$是环的长度。这种弹道电流有一个简单的解释：这是由于单个相干电子与边缘平行移动，因此感觉不到粗糙度。我们的计算解释了一个令人困惑的实验结果$I_{typ}\simeq e v_F/L$，报告由Escherasekhar等人。67，3578（1991）]，用于长度为$L \simeq 100 l$的金属环。如果无序是由于晶界，我们的结果同意扩散的结果$I_{typ}\simeq (e v_F/L) (l/L)$，由Cheung等人[Phys. Rev. Lett. 62，587（1989）]并由Bluhm等人[Phys.Rev.Lett. 102，136802（2009）]和Bleszynsky-Jayich等人[Science 326，272（2009）]。
英文摘要：
Typical persistent current ($I_{typ}$) in a normal metal ring with disorder due to random grain boundaries and rough edges is calculated microscopically. If disorder is due to the rough edges, a ballistic current $I_{typ}\simeq e v_F/L$ is found in spite of the diffusive resistance ($ \propto L/l$), where $v_F$ is the Fermi velocity, $l$ is the mean free path, and $L \gg l$ is the ring length. This ballistic current has a simple interpretation: It is due to a single coherent electron that moves in parallel with the edges and thus does not feel the roughness. Our calculations explain a puzzling experimental result $I_{typ}\simeq e v_F/L$, reported by Chandrasekhar et al. [Phys. Rev. Lett. 67, 3578 (1991)] for metal rings of length $L \simeq 100 l$. If disorder is due to the grain boundaries, our results agree with diffusive result $I_{typ}\simeq (e v_F/L) (l/L)$, derived by Cheung et al. [Phys. Rev. Lett. 62, 587 (1989)] and observed by Bluhm et al. [Phys. Rev. Lett. 102, 136802 (2009)] and Bleszynsky-Jayich et al. [Science 326, 272 (2009)].
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