在CLIC上测量轻味夸克的质量和截面
Mass and Cross Section Measurement of light-flavored Squarks at CLIC
摘要：
本文介绍了在基于CLIC技术的3 TeV电子对撞机上测量TeV量级轻味右夸克质量及其产生截面的前景。在CLIC概念设计报告的框架内进行的分析是基于CLIC_ILD探测器概念的完整Geant 4模拟，包括标准模型物理背景和来自双光子过程的机器相关强子背景。使用粒子流事件重建来重建事件，并且从根据发生器级模拟构建的模板拟合获得质量，并使用涂抹来参数化检测器响应。当积分亮度为2/ab时，未分离的第一代和第二代右夸克的统计精度为5.9 GeV，相当于0.52%.对于组合截面，获得0.07 fb的精度，对应于5%。
英文摘要：
We present a study of the prospects for the measurement of TeV-scale light-flavored right-squark masses and the corresponding production cross section at a 3 TeV e+e- collider based on CLIC technology. The analysis, performed in the framework of the CLIC Conceptual Design Report, is based on full Geant4 simulations of the CLIC_ILD detector concept, including standard model physics background and machine related hadronic background from two-photon processes. The events are reconstructed using particle flow event reconstruction, and the mass is obtained from a template fit built from generator-level simulations with smearing to parametrize the detector response. For an integrated luminosity of 2/ab, a statistical precision of 5.9 GeV, corresponding to 0.52%, is obtained for unseparated first and second generation right squarks. For the combined cross section, a precision of 0.07 fb, corresponding to 5%, is obtained.
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