CSRm双电子复合实验失谐系统的测试
Test of detuning system for dielectronic recombination experiment at CSRm
摘要：
带有电子冷却器的储存环是进行双电子复合（DR）实验的理想平台。为了满足在主冷却储存环上进行DR测量的要求，在电子冷却器装置上安装了用于精确控制离子束和电子束之间的相对能量的失谐系统。使用7.0 MeV/u C6+束进行了测试运行，以检查该系统对存储离子束性能的影响。记录肖特基谱和离子束电流以监测束流状态。研究了失谐电压脉冲宽度和脉冲高度对离子束的影响。对于小脉冲高度，肖特基谱的实验结果与理论结果符合得很好。在肖特基频谱的频移显着减少的短脉冲宽度。对于大的脉冲高度，观察到振荡现象。从肖特基谱中我们发现振荡幅度与失谐脉冲宽度和离子束强度有关。本文对这一现象进行了详细的描述，并建立了基于等离子体振荡的理论模型。
英文摘要：
The storage ring equipped with an electron cooler is an ideal platform for dielectronic recombination (DR) experiments. In order to fulfil the requirement of DR measurements at the main Cooler Storage Ring, a detuning system for the precision control of the relative energy between the ion beam and the electron beam has been installed on the electron cooler device. The test run using 7.0 MeV/u C6+ beam was performed to examine the influence of this system on the performance of the stored ion beam. The Schottky spectra and the ion beam currents were recorded to monitor the beam status. The influence of pulse heights and widths of the detuning voltage on the ion beam was investigated. For the small pulse height, the experimental results from the Schottky spectrum were in good agreement with the theoretical results. The frequency shift in the Schottky spectrum is significantly reduced for the short pulse width. For the large pulse height, an oscillation phenomenon was observed. From the Schottky spectrum, we found the oscillation amplitude is dependent on the pulse width of detuning and the ion beam intensity. The detailed description of the phenomenon and the theoretical model based on the plasma oscillation was discussed in this paper.
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