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arXiv 1201.0109cond-mat.mtrl-sci
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软X射线共振衍射法测定钒的Refractive index

Refractive index of vanadium determined by resonant diffraction of soft x-rays

Martin Magnuson, Coryn F. Hague

摘要:

通过测量V/Fe超晶格一级衍射峰的角位移,确定了钒折射率的色散部分。使用椭圆偏振同步辐射进行测量,该辐射针对不同的入射散射角扫描通过VL 2,3吸收边。X射线散射技术提供了通过吸收共振直接确定折射率的色散部分的途径。通过比较吸收校正和色散校正,示出了在共振处吸收的影响。结果表明,在钒的L2,3共振态,1-δ大于1,并讨论了其光学性质.

英文摘要:

The dispersive part of the refractive index of vanadium is determined by measuring the angular displacement of the first order diffraction peak of a V/Fe superlattice. The measurements were made using elliptically polarized synchrotron radiation which was scanned through the V L2,3 absorption edges for different incident scattering angles. The x-ray scattering technique provides access to direct determination of the dispersive part of the refractive index through an absorption resonance. The influence of absorption at the resonances is shown by comparing the absorption correction to the dispersion correction. The results demonstrate that 1-δ is larger than unity at the L2,3 resonances of vanadium and the optical consequences are discussed.

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