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arXiv 1111.1052cond-mat.mes-hall
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用Aharonov-Bohm干涉仪探测拓扑绝缘体表面从类弱反定域到定域的交叉

Probing crossover from analogous weak antilocalization to localization by an Aharonov-Bohm interferometer on topological insulator surface

Zhen-Guo Fu, Ping Zhang, Shu-Shen Li

摘要:

提出了一种在拓扑绝缘体(TI)表面的扫描隧道显微镜Aharonov-Bohm(AB)干涉仪,用于探测自旋分辨局域态密度(LDOS)中的AB振荡导致的弱反局域化(WAL)到弱局域化(WL)的交叉现象.基于我们的分析和数值计算结果,我们发现随着TI表面态能隙的增大,自旋分辨LDOS中的$Φ_{0}/2$ = $hc/2e$周期AB振荡逐渐过渡到$Φ_{0}$周期振荡.

英文摘要:

We propose a scanning tunneling microscopy Aharonov-Bohm (AB) interferometer on the surface of a topological insulator (TI) to probe the crossover from analogous weak antilocalization (WAL) to weak localization (WL) phenomenon via the AB oscillations in spin-resolved local density of states (LDOS). Based on our analytical and numerical results, we show that with increasing the energy gap of TI surface states, the $Φ_{0}/2$=$hc/2e$ periodic AB oscillations in spin-resolved LDOS gradually transit into the $Φ_{0}$ periodic oscillations.

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