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arXiv 1102.0433astro-ph.HE
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1H 0707-495的X射线反射发射率剖面的测定

Determination of the X-ray reflection emissivity profile of 1H 0707-495

D. R. Wilkins, A. C. Fabian

摘要:

当考虑活动星系核吸积盘表面反射产生的X射线谱时,必须考虑吸积盘上反射通量的变化,即辐射率分布。这将取决于包括X射线源的位置和几何形状以及椎间盘特性在内的因素。我们直接获得的辐射率分布的光盘从观察到的光谱考虑的反射分量的贡献的总和从连续的半径在光盘和拟合找到这些组件的相对权重在相对论加宽的发射线。该方法已成功地恢复已知的发射率配置文件从合成光谱,并适用于XMM牛顿光谱的窄线塞弗特1星系1H 0707-495。这些数据意味着一个两次打破的幂律形式的发射率法律与陡峭的档案在内部地区的光盘(指数7.8),然后一个平坦的区域之间的5.6rg和34.8rg之前趋于一个恒定的指数为3.3的光盘的外部区域。观测到的发射率分布的形式与理论预测一致,从而加强了反射解释。

英文摘要:

When considering the X-ray spectrum resulting from the reflection off the surface of accretion discs of AGN, it is necessary to account for the variation in reflected flux over the disc, i.e. the emissivity profile. This will depend on factors including the location and geometry of the X-ray source and the disc characteristics. We directly obtain the emissivity profile of the disc from the observed spectrum by considering the reflection component as the sum of contributions from successive radii in the disc and fitting to find the relative weightings of these components in a relativistically-broadened emission line. This method has successfully recovered known emissivity profiles from synthetic spectra and is applied to XMM-Newton spectra of the Narrow Line Seyfert 1 galaxy 1H 0707-495. The data imply a twice-broken power law form of the emissivity law with a steep profile in the inner regions of the disc (index 7.8) and then a flat region between 5.6rg and 34.8rg before tending to a constant index of 3.3 over the outer regions of the disc. The form of the observed emissivity profile is consistent with theoretical predictions, thus reinforcing the reflection interpretation.

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