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arXiv 1101.0915physics.flu-dyn
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光滑微图案化缺陷上的润湿

Wetting on smooth micropatterned defects

Damien Debuisson, Renaud Dufour, Vincent Senez, Steve Arscott

摘要:

我们开发了一个模型,预测光滑的微图案化缺陷引入的接触角滞后。用光滑函数对缺陷进行建模,并用切线解解释了接触角滞后现象。当微弯月面同时接触缺陷的两侧时,接触线发生脱钉。使用光刻胶和实验结果证实了该模型的缺陷。重要的一点是该模型是尺度无关的,即接触角滞后取决于函数的纵横比,而不是其绝对大小;这可能对自然表面缺陷有影响。

英文摘要:

We develop a model which predicts the contact angle hysteresis introduced by smooth micropatterned defects. The defects are modeled by a smooth function and the contact angle hysteresis is explained using a tangent line solution. When the liquid micro-meniscus touches both sides of the defect simultaneously, depinning of the contact line occurs. The defects are fabricated using a photoresist and experimental results confirm the model. An important point is that the model is scale-independent, i.e. the contact angle hysteresis is dependent on the aspect ratio of the function, not on its absolute size; this could have implications for natural surface defects.

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