用碳纳米团簇校准原子天平
Calibrating the atomic balance by carbon nanoclusters
摘要：
使用由碳纳米团簇质量标准校准的扫描透射电子显微镜，以接近原子级的精度对碳原子进行计数。线性校准曲线控制从几个碳原子到34，000个原子的工作区。这种线性使得散射截面的适当平均化成为可能，尽管使用了粗质量参考，但仍赋予实验接近原子级的精度。这种方法的一个示例被提供用于堆叠的石墨烯片的薄层。厚度低于100纳米的悬浮薄片可以可视化，从而在光学和扫描探针方法无法实现的范围内提供定量测量。
英文摘要：
Carbon atoms are counted at near atomic-level precision using a scanning transmission electron microscope calibrated by carbon nanocluster mass standards. A linear calibration curve governs the working zone from a few carbon atoms up to 34,000 atoms. This linearity enables adequate averaging of the scattering cross sections, imparting the experiment with near atomic-level precision despite the use of a coarse mass reference. An example of this approach is provided for thin layers of stacked graphene sheets. Suspended sheets with a thickness below 100 nm are visualized, providing quantitative measurement in a regime inaccessible to optical and scanning probe methods.
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