基于二次测量本征模的亚衍射聚焦
Sub-diffraction Focussing using Quadratic Measure Eigenmodes
摘要：
一个多世纪以来，衍射理论一直被认为限制了光学领域中聚焦和成像的分辨率。可实现的最小光斑的大小与可用的空间波矢的范围成反比。在这里，我们表明，它是可能的本地击败衍射极限的效率为代价。该方法基于麦克斯韦方程组的线性，并且光与其周围环境之间的相互作用可以被认为是相对于电磁场的二次性质。我们将强度和光斑尺寸表示为具有相关本征模的二次测量。使用动态衍射光学元件，我们证明光学聚焦到小于衍射极限的4倍的区域。通用方法可以应用于与可以用二次形式表示的电磁场的线性和可测量性质有关的许多物理现象。
英文摘要：
For over a century diffraction theory has been thought to limit the resolution of focusing and imaging in the optical domain. The size of the smallest spot achievable is inversely proportional to the range of spatial wavevectors available. Here, we show that it is possible to locally beat the diffraction limit at the expense of efficiency. The method is based on the linearity of Maxwell's equations and that the interaction between light and its surroundings may be considered quadratic in nature with respect to the electromagnetic fields. We represent the intensity and spot size as a quadratic measure with associated eigenmodes. Using a dynamic diffractive optical element, we demonstrate optical focussing to an area 4 times smaller than the diffraction limit. The generic method may be applied to numerous physical phenomena relating to linear and measurable properties of the electromagnetic field that can be expressed in a quadratic form.
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