局域电子向列序系统中STM的噪声预测
Noise Predictions for STM in Systems with Local Electron Nematic Order
摘要：
我们建议，在局部条纹取向的热噪声应该很容易通过STM检测系统中，局部条纹取向强烈影响的淬火无序。在二维和准二维系统中，条纹是一种单向的、纳米尺度的电荷调制，它受到淬火无序的强烈影响。虽然条纹取向倾向于锁定主要的晶格方向，掺杂剂无序局部破坏旋转对称性。在具有其他$C_4$旋转对称性的主体晶体中，在存在淬火无序的情况下条纹取向映射到随机场伊辛模型。虽然这种系统的低温状态通常是二维或强层状系统中的条纹玻璃，但随着温度升高，条纹取向波动变得更加普遍。我们建议，这些热激发的波动应该是很容易检测到的扫描隧道光谱作为{ \em电报噪声}在本地$I(V)$曲线的高电压部分。我们预测这种噪声的空间，时间和热演化，包括这种噪声最有可能被观察到的情况。此外，我们提出了一个原位测试，适合任何本地扫描探头，用于评估这种噪声是否是由于相关的波动，而不是独立的开关。
英文摘要：
We propose that thermal noise in local stripe orientation should be readily detectable via STM on systems in which local stripe orientations are strongly affected by quenched disorder. Stripes, a unidirectional, nanoscale modulation of electronic charge, are strongly affected by quenched disorder in two-dimensional and quasi-two-dimensional systems. While stripe orientations tend to lock to major lattice directions, dopant disorder locally breaks rotational symmetry. In a host crystal with otherwise $C_4$ rotational symmetry, stripe orientations in the presence of quenched disorder map to the random field Ising model. While the low temperature state of such a system is generally a stripe glass in two dimensional or strongly layered systems, as the temperature is raised, stripe orientational fluctuations become more prevalent. We propose that these thermally excited fluctuations should be readily detectable in scanning tunneling spectroscopy as {\em telegraph noise} in the high voltage part of the local $I(V)$ curves. We predict the spatial, temporal, and thermal evolution of such noise, including the circumstances under which such noise is most likely to be observed. In addition, we propose an in-situ test, amenable to any local scanning probe, for assessing whether such noise is due to correlated fluctuations rather than independent switchers.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
