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arXiv 0912.4567cond-mat.mes-hall
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石墨烯铁磁-绝缘体-超导体结的隧穿电导

Tunneling conductance of graphene ferromagnet-insulator-superconductor junctions

Ya-Fen Hsu, Guang-Yu Guo

摘要:

通过求解自旋极化的Dirac-Bogoliubov-de-Gennes方程,采用Blonder-Tinkham-Klapwijk方法研究了石墨烯铁磁-绝缘体超导(FIS)结的输运性质.我们发现,在交换作用的存在下,石墨烯FIS结中的逆反射和镜面Andreev反射发生了显著的改变,并且隧道电流的自旋极化($P_T$)可以通过偏置电压($V$)从正值调节到负值.在薄势垒极限下,石墨烯FIS结的电导$G$作为势垒强度$χ$的函数振荡。电导振荡的幅度和相位都随交换能$E_{ex}$而变化。对于$E_{ex}<E_F$(费米能),振荡幅度随着$E_{ex}$而减小。对于$E_{ex}^{c}>E_{ex}>E_F$,振荡幅度随着$E_{ex}$的增加而增加,其中$E_{ex}^{c}=2E_{F}+U_{0}$($U_{0}$是在结的超导段上施加的静电势)。对于$E_{ex} > E_{ex}^{c}$,振荡幅度再次随着$E_{ex}$而降低。有趣的是,$χ$中$π/2$的普遍相位差存在于$E_{ex}>E_F$和$E_{ex}<E_F$的$G-χ$曲线之间。最后,我们发现反射和镜面Andreev反射之间的跃迁发生在$eV=|E_{F}-E_{ex}|$和$eV=E_{ex}+E_{F}$处,因此在这些偏置电压附近电导的奇异行为是镜面反射和反射Andreev反射之间输运性质的差异造成的.

英文摘要:

We study the transport properties of a graphene ferromagnet-insulator superconductor (FIS) junction within the Blonder-Tinkham-Klapwijk formalism by solving spin-polarized Dirac-Bogoliubov-de-Gennes equation. We find that the retro and specular Andreev reflections in the graphene FIS junction are drastically modified in the presence of exchange interaction and that the spin-polarization ($P_T$) of tunneling current can be tuned from the positive to negative value by bias voltage ($V$). In the thin-barrier limit, the conductance $G$ of a graphene FIS junction oscillates as a function of barrier strength $χ$. Both the amplitude and phase of the conductance oscillation varies with the exchange energy $E_{ex}$. For $E_{ex}<E_F$ (Fermi energy), the amplitude of oscillation decreases with $E_{ex}$. For $E_{ex}^{c}>E_{ex}>E_F$, the amplitude of oscillation increases with $E_{ex}$, where $E_{ex}^{c}=2E_{F}+U_{0}$ ($U_{0}$ is the applied electrostatic potential on the superconducting segment of the junction). For $E_{ex} > E_{ex}^{c}$, the amplitude of oscillation decreases with $E_{ex}$ again. Interestingly, a universal phase difference of $π/2$ in $χ$ exists between the $G-χ$ curves for $E_{ex}>E_F$ and $E_{ex}<E_F$. Finally, we find that the transitions between retro and specular Andreev reflections occur at $eV=|E_{F}-E_{ex}|$ and $eV=E_{ex}+E_{F}$, and hence the singular behavior of the conductance near these bias voltages results from the difference in transport properties between specular and retro Andreev reflections.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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