Concept of spectrometer for resonant inelastic X-ray scattering with parallel detection in incoming and outgoing photon energies

英文摘要：

A spectrometer for resonant inelastic X-ray scattering (RIXS) is proposed where imaging and dispersion actions in two orthogonal planes are combined to deliver full two-dimensional map of RIXS intensity in one shot with parallel detection in incoming hvin and outgoing hvout photon energies. Preliminary ray-tracing simulations with a typical undulator beamline demonstrate a resolving power well above 11000 in both hvin and hvout near a photon energy of 930 eV, with a vast potential for improvement. Combining such a spectrometer - nicknamed hv2 - with an XFEL source allows efficient time-resolved RIXS experiments.