La（2-x）CexCuO4薄膜中厚度引起的氧还原不足
Thickness-induced insufficient oxygen reduction in La(2-x)CexCuO4 thin films
摘要：
制备了一系列不同厚度的电子掺杂铜酸盐La（2-x）CexCuO 4薄膜，并通过调整退火时间来保证最高的超导转变温度。输运测量表明，随着薄膜厚度的增加（<100 nm），剩余电阻率增大，霍尔系数负移。此外，X射线衍射数据表明，c轴晶格常数c 0随薄膜厚度的减小而增大。这些异常现象可归因于薄膜中的氧还原不足。考虑到SrTiO 3衬底和薄膜之间ab平面的晶格失配，来自衬底的压应力可能是导致薄膜中氧更难还原的原因。
英文摘要：
A series of electron-doped cuprate La(2-x)CexCuO4 thin films with different thicknesses have been fabricated and their annealing time are adjusted carefully to ensure the highest superconducting transition temperature. The transport measurements indicate that, with the increase of the film thickness (<100 nm), the residual resistivity increases and the Hall coefficient shifts in the negative direction. Further more, the X-ray diffraction data reveal that the c-axis lattice constant c0 increases with the decrease of film thickness. These abnormal phenomena can be attributed to the insufficient oxygen reduction in the thin films. Considering the lattice mismatching in the ab-plane between the SrTiO3 substrates and the films, the compressive stress from the substrates may be responsible for the more difficult reduction of the oxygen in the thin films.
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