SrTiO $_{3}$断裂表面的纳米尺度条纹状表面终端
Nanometer-scale striped surface terminations on fractured SrTiO$_{3}$ surfaces
摘要：
利用扫描隧道显微镜对原位断裂的SrTiO $_{3}$（复合氧化物薄膜和超晶格生长最常用的衬底之一）进行了观察，在（001）表面观察到了原子级光滑的台阶。此外，发现在室温下使该材料断裂导致形成具有在长范围内延伸的交替表面终端的特征宽度（约10 nm至约20 nm）的条纹图案化域。利用光谱技术的空间表征揭示了两个域的电子结构的强烈对比。结合这些结果与地形数据，我们能够分配TiO $_{2}$和SrO终端到各自的域。该原理验证实验的结果表明，使该材料断裂导致可再现的平坦表面，其可以在原子尺度上表征，并表明该技术可用于技术相关的复杂氧化物界面的研究。
英文摘要：
Using cross-sectional scanning tunneling microscopy on in situ fractured SrTiO$_{3}$, one of the most commonly used substrates for the growth of complex oxide thin films and superlattices, atomically smooth terraces have been observed on (001) surfaces. Furthermore, it was discovered that fracturing this material at room temperature results in the formation of stripe patterned domains having characteristic widths (~10 nm to ~20 nm) of alternating surface terminations that extend over a long-range. Spatial characterization utilizing spectroscopy techniques revealed a strong contrast in the electronic structure of the two domains. Combining these results with topographic data, we are able to assign both TiO$_{2}$ and SrO terminations to their respective domains. The results of this proof-of-principle experiment reveal that fracturing this material leads to reproducibly flat surfaces that can be characterized at the atomic-scale and suggests that this technique can be utilized for the study of technologically relevant complex oxide interfaces.
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