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arXiv 0906.5599physics.plasm-phphysics.space-ph
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高Lundquist数等离子体中二次撕裂不稳定性引起的快速重联

Fast Reconnection in High-Lundquist-Number Plasmas Due to Secondary Tearing Instabilities

A. Bhattacharjee, Yi-Min Huang, H. Yang, B. Rogers

摘要:

大尺寸系统中的薄电流片超过临界值的Lundquist数是不稳定的超Alfvenic撕裂不稳定性。增长最快的不稳定性的增长率相对于伦德奎斯特数的缩放示出遵循从经典的撕裂模式的色散关系。由于这种不稳定性,该系统实现了一个非线性的重连率,似乎是弱依赖于Lundquist数,并大于Sweet-Parker率的数量级(对于考虑的Lundquist数的范围)。这种快速重联的制度似乎是可实现的动态和高度不稳定的薄电流片,而不需要电流片是湍流。

英文摘要:

Thin current sheets in systems of large size that exceed a critical value of the Lundquist number are unstable to a super-Alfvenic tearing instability. The scaling of the growth rate of the fastest growing instability with respect to the Lundquist number is shown to follow from the classical dispersion relation for tearing modes. As a result of this instability, the system realizes a nonlinear reconnection rate that appears to be weakly dependent on the Lundquist number, and larger than the Sweet-Parker rate by an order of magnitude (for the range of Lundquist numbers considered). This regime of fast reconnection appears to be realizable in a dynamic and highly unstable thin current sheet, without requiring the current sheet to be turbulent.

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