用线性吸收光谱测定聚噻吩薄膜的激子带宽和薄膜微结构
Determining exciton bandwidth and film microstructure in polythiophene films using linear absorption spectroscopy
摘要：
我们分析的线性吸收光谱的区域规则的聚（3-hexylthiophene）薄膜纺从各种溶剂中直接探测膜的微观结构，以及它如何取决于加工条件。我们估计的激子带宽和百分比的薄膜组成的聚集体定量使用弱相互作用的H-聚集模型。这提供了对薄膜内微晶的程度和质量的描述，并且又与薄膜场效应晶体管特性相关。
英文摘要：
We analyze the linear absorption spectrum of regioregular poly(3-hexylthiophene) films spun from a variety of solvents to probe directly the film microstructure and how it depends on processing conditions. We estimate the exciton bandwidth and the percentage of the film composed of aggregates quantitatively using a weakly interacting H-aggregate model. This provides a description of the degree and quality of crystallites within the film and is in turn correlated with thin-film field-effect transistor characteristics.
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