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arXiv 0810.4312cond-mat.dis-nn
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无序薄膜中电流-电压特性的突变

Jumps in current-voltage characteristics in disordered films

B. L. Altshuler, V. E. Kravtsov, I. V. Lerner, I. L. Aleiner

摘要:

我们认为,在InO,TiN和YSi无序样品中观察到的有限电压下的电流巨跳表现出由电子过热引起的双稳态。其中一个稳定状态是过热的,因此是低电阻的,而另一个高电阻的状态被相同的电压加热得少得多。如果电子的冷却是低效的,并且平衡电阻R(T)的温度依赖性足够陡峭,则发生双稳态。我们使用实验R(T)和假设声子机制的冷却考虑到其强大的抑制无序。我们的描述的细节的I-V特性不涉及可调参数,原来是在定量协议与实验。我们提出了更直接检查这一物理图像的实验。

英文摘要:

We argue that giant jumps of current at finite voltages observed in disordered samples of InO, TiN and YSi manifest a bistability caused by the overheating of electrons. One of the stable states is overheated and thus low-resistive, while the other, high-resistive state is heated much less by the same voltage. The bistability occurs provided that cooling of electrons is inefficient and the temperature dependence of the equilibrium resistance, R(T), is steep enough. We use experimental R(T) and assume phonon mechanism of the cooling taking into account its strong suppression by disorder. Our description of details of the I-V characteristics does not involve adjustable parameters and turns out to be in a quantitative agreement with the experiments. We propose experiments for more direct checks of this physical picture.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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