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arXiv 0807.3798cond-mat.supr-con
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高$T_c$本征约瑟夫森结中的多重再俘获过程

Multiple-Retrapping Process in High-$T_c$ Intrinsic Josephson Junctions

Myung-Ho Bae, M. Sahu, Hu-Jong Lee, A. Bezryadin

摘要:

本文测量了铜氧化物本征约瑟夫森结中从相扩散分支到准粒子隧穿分支的开关电流分布随温度的变化。与热激活模型相反,SWCD的宽度随着温度的降低而增加,直到1.5 K。基于多重再俘获模型,我们定量地证明了在相扩散制度中结的品质因数决定了所观察到的SWCD的温度依赖性。

英文摘要:

We report measurements of switching-current distribution (SWCD) from a phase-diffusion branch to a quasiparticle-tunneling branch as a function of temperature in a cuprate-based intrinsic Josephson junction. Contrary to the thermal-activation model, the width of the SWCD increases with decreasing temperature, down to 1.5 K. Based on the multiple-retrapping model, we quantitatively demonstrate that the quality factor of the junction in the phase-diffusion regime determines the observed temperature dependence of the SWCD.

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