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arXiv 0803.0896astro-ph
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亮1型Seyfert星系的宽带XMM-牛顿谱和INTEGRAL谱

The broad-band XMM-Newton and INTEGRAL spectra of bright type 1 Seyfert galaxies

F. Panessa, L. Bassani, A. De Rosa, A. J. Bird, A. J. Dean, M. Fiocchi, A. Malizia, M. Molina, P. Ubertini, R. Walter

摘要:

本文分析了9个明亮的1型塞弗特星系的0.5-150 keV宽带光谱。这些源已被INTEGRAL发现/探测到,随后用XMM-牛顿首次以低于10 keV的高灵敏度进行了观测。样品,虽然小,是人口的1型活动星系核,现在正在观察到超过20千电子伏的代表。已使用三种不同的参数化建模的内在连续:幂律模型,指数截止幂律和指数截止幂律与康普顿反射分量。在每个模型的存在下,固有的吸收,软组件和发射线再处理功能也进行了测试。一个简单的幂律模型是一个统计上很好的描述大多数的光谱在这里提出的FeK线,完全和/或部分覆盖吸收和软光谱成分中检测到的大多数样品源。平均光子指数(< Gamma >= 1.7 $\pm$ 0.2)是一致的,在误差范围内,与正则光谱斜率经常观察到的活动星系核,虽然光子指数分布峰值在我们的情况下,在平坦的伽玛(~ 1.5)值。对于四个源,我们发现一个显着改善的拟合时,幂律是指数截止的能量被约束为低于150千电子伏。康普顿反射参数只能在样本的两个对象中估计,并且在两种情况下都发现R &gt; 1。

英文摘要:

The 0.5-150 keV broad-band spectra of a sample of nine bright type 1 Seyfert galaxies are analyzed here. These sources have been discovered/detected by INTEGRAL and subsequently observed with XMM--Newton for the first time with high sensitivity below 10 keV. The sample, although small, is representative of the population of type 1 AGN which are now being observed above 20 keV. The intrinsic continuum has been modeled using three different parameterizations: a power-law model, an exponential cut-off power-law and an exponential cut-off power-law with a Compton reflection component. In each model the presence of intrinsic absorption, a soft component and emission line reprocessing features has also been tested. A simple power-law model is a statistically good description of most of the spectra presented here; an FeK line, fully and/or partial covering absorption and a soft spectral component are detected in the majority of the sample sources. The average photon index (< Gamma > = 1.7 $\pm$ 0.2) is consistent, within errors, with the canonical spectral slope often observed in AGN although the photon index distribution peaks in our case at flat Gamma (~ 1.5) values. For four sources, we find a significantly improved fit when the power-law is exponentially cut-off at an energy which is constrained to be below ~ 150 keV. The Compton reflection parameter could be estimated in only two objects of the sample and in both cases is found to be R > 1.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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