Domain Dynamics in Piezoresponse Force Microscopy: Quantitative Deconvolution and Hysteresis Loop Fine Structure

Dynamic Behavior in Piezoresponse Force Microscopy

Frequency dependent dynamic behavior in Piezoresponse Force Microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analyzed using a combination of modeling and experimental measurements. The PFM signal comprises contributions from local electrostatic forces acting on the tip, distributed forces acting on the cantilever, and three components of the electromechanical response vector. These interactions result in the bending and torsion of the cantilever, detected as vertical and lateral PFM signals. The relative magnitudes of these contributions depend on geometric pa…

Local Polarization Switching in the Presence of Surface Charged Defects: Microscopic Mechanisms and Piezoresponse Force Spectroscopy Observations

The thermodynamics and kinetics of tip-induced polarization switching in Piezoresponse Force Microscopy in the presence of surface charge defects is studied using the combination of analytical and numerical techniques. The signature of the defects in hysteresis loop fine structure and Switching Spectroscopy PFM images is identified and compared to experimental observations. An approach for the deconvolution of PFM spectroscopy measurements to extract relevant defect parameters is derived. This methodology is universal and can be extended to switching in other ferroics and in reversible electro…

Learning the right channel in multimodal imaging: automated experiment in Piezoresponse Force Microscopy

We report the development and experimental implementation of the automated experiment workflows for the identification of the best predictive channel for a phenomenon of interest in spectroscopic measurements. The approach is based on the combination of ensembled deep kernel learning for probabilistic predictions and a basic reinforcement learning policy for channel selection. It allows the identification of which of the available observational channels, sampled sequentially, are most predictive of selected behaviors, and hence have the strongest correlations. We implement this approach for mu…

Resolution Function Theory in Piezoresponse Force Microscopy: Domain Wall Profile, Spatial Resolution, and Tip Calibration

Piezoresponse Force Microscopy (PFM) has emerged as a primary tool for imaging, domain engineering, and switching spectroscopy on ferroelectric materials. Quantitative interpretation of PFM data including measurements of the intrinsic width of the domain walls, geometric parameters of the domain below the tip in local hysteresis loop measurements, as well as interpretation of switching and coercive biases in terms of materials properties and switching mechanisms, requires reliable knowledge on electrostatic field structure produced by the tip. Using linear imaging theory, we develop a theoreti…

Piezoresponse Force Spectroscopy of Ferroelectric Materials

Piezoresponse Force Spectroscopy (PFS) has emerged as a powerful technique for probing highly localized switching behavior and the role of microstructure and defects on switching. The application of a dc bias to a scanning probe microscope tip in contact with a ferroelectric surface results in the nucleation and growth of a ferroelectric domain below the tip, resulting in changes in local electromechanical response. Resulting hysteresis loops contains information on local ferroelectric switching behavior. The signal in PFS is the convolution of the volume of the nascent domain and the probing …

A New Heterodyne Megasonic Piezoresponse Force Microscopy with High-frequency Excitation beyond 100 MHz

Piezoresponse Force Microscopy (PFM), as a powerful nanoscale characterization technique, has been extensively utilized to elucidate diverse underlying physics of ferroelectricity. However, the intensive study of conventional PFM has revealed a growing number of concerns and limitations which are largely challenging its validity and application. Herein, we developed a new advanced PFM technique, named Heterodyne Megasonic Piezoresponse Force Microscopy (HM-PFM), which uniquely uses 106 to 108 Hz high-frequency excitation and heterodyne method to measure the piezoelectric strain at nanoscale. W…

Experimental discovery of structure-property relationships in ferroelectric materials via active learning

Emergent functionalities of structural and topological defects in ferroelectric materials underpin an extremely broad spectrum of applications ranging from domain wall electronics to high dielectric and electromechanical responses. Many of these have been discovered and quantified via local scanning probe microscopy methods. However, the search for these functionalities has until now been based by either trial and error or using auxiliary information such as topography or domain wall structure to identify potential objects of interest based on the intuition of operator or preexisting hypothese…

Room Temperature Ferroelectricity in Continuous Croconic Acid Thin Films

Ferroelectricity at room temperature has been demonstrated in nanometer-thin quasi 2D croconic acid thin films, by the polarization hysteresis loop measurements in macroscopic capacitor geometry, along with observation and manipulation of the nanoscale domain structure by piezoresponse force microscopy. The fabrication of continuous thin films of the hydrogen-bonded croconic acid was achieved by the suppression of the thermal decomposition using low evaporation temperatures in high vacuum, combined with growth conditions far from thermal equilibrium. For nominal coverages >=20 nm, quasi 2D and…

光铁电耦合与极化控制的界面能带调制在范德华化合物CuInP2S6中

Photoferroelectric Coupling and Polarization-Controlled Interfacial Band Modulation in van der Waal Compound CuInP2S6

研究光激发与极化及界面静电学在范德华铁电体中的耦合机制，揭示CuInP2S6中光激发调控能带弯曲、铁电开关及Cu+离子弛豫的机制，为光控纳米电子和光电设备设计提供框架。

Nanoscale Non-Destructive Ferroelectric Characterization with Non-Contact Heterodyne Electrostrain Force Microscopy

Perceiving nanoscale ferroelectric phenomena from real space is of great importance for elucidating underlying ferroelectric physics. During the past decades, nanoscale ferroelectric characterization has mainly relied on the Piezoresponse Force Microscopy (PFM), however, the fundamental limitations of PFM have made the nanoscale ferroelectric studies encounter significant bottlenecks. In this study, a high-resolution non-contact ferroelectric measurement, named Non-Contact Heterodyne Electrostrain Force Microscopy (NC-HEsFM), has been introduced firstly. It has been unambiguously demonstrated …

Quantitative Electromechanical Atomic Force Microscopy

The ability to probe a materials electromechanical functionality on the nanoscale is critical to applications from energy storage and computing to biology and medicine. Voltage modulated atomic force microscopy (VM-AFM) has become a mainstay characterization tool for investigating these materials due to its unprecedented ability to locally probe electromechanically responsive materials with spatial resolution from microns to nanometers. However, with the wide popularity of VM-AFM techniques such as piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM) there has been …