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arXiv 0802.1629cond-mat.str-el
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二维金属-绝缘体转变:双参数标度的实验测试

Metal-Insulator Transition in 2D: Experimental Test of the Two-Parameter Scaling

D. A. Knyazev, O. E. Omel'yanovskii, V. M. Pudalov, I. S. Burmistrov

摘要:

我们报告了在2D金属-绝缘体转变附近的几个高迁移率2D电子系统的电阻率ρ(T,n)测量的详细标度分析。我们使用双参数标度方法和一般标度思想分析数据。这使我们能够确定临界电子密度,两个临界指数,和温度依赖性的分界线在自洽的方式。此外,我们还重建了描述双参数曲面的经验标度函数,该函数与ρ(T,n)数据拟合良好.

英文摘要:

We report a detailed scaling analysis of resistivity ρ(T,n) measured for several high-mobility 2D electron systems in the vicinity of the 2D metal-insulator transition. We analyzed the data using the two parameter scaling approach and general scaling ideas. This enables us to determine the critical electron density, two critical indices, and temperature dependence for the separatrix in the self-consistent manner. In addition, we reconstruct the empirical scaling function describing a two-parameter surface which fits well the ρ(T,n) data.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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