受抑系统中屏蔽效应引起的慢弛豫机制
Mechanism of Slow Relaxation due to Screening Effect in a Frustrated System
摘要:
我们研究了一个慢弛豫过程中的挫折自旋系统,其中一种类型的屏蔽效应,由于挫折的环境起着重要的作用。这种屏蔽效应归因于受抑环境的高度简并构型。这种缓慢的弛豫是由于熵效应,并且与在随机铁磁体等系统中观察到的能量势垒不同。在本系统中,即使不存在能隙,仍会发生慢弛豫。因此,我们称这种现象为“熵变慢”。在这里,我们定量地研究了具有所谓修饰键的伊辛自旋模型中熵变慢的机制。修饰键中包含的自旋(修饰自旋)导致了特殊的态密度,这导致了熵诱导屏蔽效应。我们分析估计了系统的时间尺度,该时间尺度随着装饰旋转的数量呈指数级增加。我们证明了在所有温度下,包括临界点的时间尺度的弛豫过程的缩放。
英文摘要:
We study a slow relaxation process in a frustrated spin system in which a type of screening effect due to a frustrated environment plays an important role. This screening effect is attributed to the highly degenerate configurations of the frustrated environment. This slow relaxation is due to an entropy effect and is different from those due to the energy barrier observed in systems such as random ferromagnets. In the present system, even if there is no energy gap, the slow relaxation still takes place. Thus, we call this phenomenon ``entropic slowing down''. Here, we study the mechanism of entropic slowing down quantitatively in an Ising spin model with the so-called decorated bonds. The spins included in decorated bonds (decoration spins) cause a peculiar density of states, which causes on entropy-induced screening effect. We analytically estimate the time scale of the system that increases exponentially with the number of decoration spins. We demonstrate the scaling of relaxation processes using the time scale at all temperatures including the critical point.
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