基于自主仿真的快速暂态故障分级技术
Techniques for Fast Transient Fault Grading Based on Autonomous Emulation
摘要：
极深亚微米和纳米技术显著提高了集成电路（IC）对辐射的敏感性。软错误是目前工作在地表的集成电路中普遍存在的问题。目前，在许多应用中需要硬化电路，而在这些应用中，容错（FT）在不久的过去并不是一个要求。使用平台FPGA进行单粒子翻转效应（SEU）的仿真，以加快FT评估的关注。在这项工作中，提出了一种新的仿真系统FT评估方面的SEU效应，提供更短的评估时间，在FPGA中执行所有的评估过程，避免仿真器主机通信瓶颈。
英文摘要：
Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at earth surface. Hardened circuits are currently required in many applications where Fault Tolerance (FT) was not a requirement in the very near past. The use of platform FPGAs for the emulation of single-event upset effects (SEU) is gaining attention in order to speed up the FT evaluation. In this work, a new emulation system for FT evaluation with respect to SEU effects is proposed, providing shorter evaluation times by performing all the evaluation process in the FPGA and avoiding emulator-host communication bottlenecks.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
