一种高效的嵌入式字存储器透明测试方案
An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories
摘要：
在系统芯片（SOC）设计中，存储器核通常是具有最小特征尺寸的密集部分。因此，存储器核的可靠性对SOC的可靠性具有重大影响。透明测试是提高存储器可靠性的有效技术之一。本文提出了一种将面向位的行进测试转换为面向字的透明行进测试的系统算法。变换后的透明行军测试具有较短的测试复杂度相比，提出了在以前的作品[理论的透明BIST的RAM，一个透明的在线存储器测试，同时检测功能故障和软错误的存储器]。例如，如果用March C-测试具有32位字的存储器，所提出的方案转换的透明面向字测试的时间复杂度仅为[Theory of transparent BIST for RAM]或[透明的在线存储器测试，用于同时检测存储器中的功能故障和软错误]。
英文摘要：
Memory cores are usually the densest portion with the smallest feature size in system-on-chip (SOC) designs. The reliability of memory cores thus has heavy impact on the reliability of SOCs. Transparent test is one of useful technique for improving the reliability of memories during life time. This paper presents a systematic algorithm used for transforming a bit-oriented march test into a transparent word-oriented march test. The transformed transparent march test has shorter test complexity compared with that proposed in the previous works [Theory of transparent BIST for RAMs, A transparent online memory test for simultaneous detection of functional faults and soft errors in memories]. For example, if a memory with 32-bit words is tested with March C-, time complexity of the transparent word-oriented test transformed by the proposed scheme is only about 56% or 19% time complexity of the transparent word-oriented test converted by the scheme reported in [Theory of transparent BIST for RAMs] or [A transparent online memory test for simultaneous detection of functional faults and soft errors in memories], respectively.
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