Casimir力的粗糙度修正：局部表面坡度的重要性
Roughness corrections to the Casimir force: The importance of local surface slope
摘要：
本文集中在一个研究中，有限电导率的修正包括在理论描述的粗糙度对卡西米尔力的影响。粗糙度数据取自蒸镀在硅球和聚苯乙烯球上的金膜。我们的结论是，与实验数据的详细比较，即在至少5%的水平，在短的分离低于200 nm，实际薄膜的粗糙度的横向尺寸应包括在理论上的考虑。此外，如果RMS粗糙度是相当大的，高的局部表面斜率被证明对卡西米尔力有显着的影响。
英文摘要：
This paper concentrates on a study where finite conductivity corrections are included in the theoretical description of the effects of roughness on the Casimir force. The roughness data were taken from gold films evaporated onto Silicon and polysterene spheres. We conclude that for a detailed comparison with experimental data, i.e. at the level of at least 5 % at short separations below 200 nm, the lateral dimensions of roughness for real films should be included in the theoretical considerations. Moreover, if the RMS roughness is considerable, high local surface slopes are shown to have a significant effect on the Casimir force.
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