利用双模态原子力显微镜中的分叉校正时变针尖-样品力测量
Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements
摘要：
扭转谐波杠杆允许在双模态原子力显微镜中测量随时间变化的针尖-样品力。这些力测量的准确性对于定量纳米机械测量是重要的。在这里，我们展示了一种方法，将扭转偏转信号转换成校准的力波形与使用的非线性动态响应的攻丝悬臂。具体地，稳定振荡状态之间的转变用于校准扭转偏转信号。
英文摘要：
Torsional harmonic cantilevers allow measurement of time varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force waveform with the use of non-linear dynamical response of the tapping cantilever. Specifically the transitions between steady oscillation regimes are used to calibrate the torsional deflection signals.
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